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Sony Corporation |
CXD2434TQ
Timing Generator for Progressive Scan CCD Image Sensor
For the availability of this product, please contact the sales office.
Description
The CXD2434TQ is an IC developed to generate
48 pin TQFP (Plastic)
the timing pulses required by the Progressive Scan
CCD image sensors as well as signal processing
circuits.
Features
• External trigger function
• Electronic shutter function
• Supports non-interlaced operation
• 30 frames/s
• Built-in driver for the horizontal (H) clock
• Base oscillation 1560 fH (24.5454 MHz)
Applications
Progressive Scan CCD cameras
Structure
Silicon gate CMOS IC
Applicable CCD Image Sensors
ICX084AK, ICX084AL
Absolute Maximum Ratings (Ta = 25 °C)
• Supply voltage
VCC VSS –0.5 to +7.0 V
• Input voltage
VI VSS –0.5 to VDD +7.0 V
• Output voltage
VI VSS –0.5 to VDD +7.0 V
• Operating temperature
Topr
–20 to +75
°C
• Storage temperature
Tstg –55 to +150 °C
Recommended Operating Conditions
• Supply voltage
VDD 4.75 to 5.25
• Operating temperature
Topr
–20 to +75
V
°C
Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by
any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the
operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.
—1—
E95605-TE
Block Diagram
RG 10
H1 13
H2 14
XSHP 21
XSHD 22
XRS 23
XV1 18
XV2 17
XV3 16
XSG 19
CLD 39
CL 38
CKO 40
CXD2434TQ
36 35 34 33 32 31
TG
PULSE GENERATOR
1/2
47 46 42 29 26 25
REGISTER
DECODE
COUNTER
GATE
3 PS
4 STRB
5 DCLK
7 DATA
8 SMD1
9 SMD2
11 XSUB
28 TEST1
48 TEST2
41 TEST3
1 2 43 44 45
6 12 15 20 24 27 30 37
Pin Configuration (Top View)
36
VSS 37
CL
CLD
CKO
TEST3
STDBY
TRIG
ESG
EFS
HD
VD
TEST2 48
1
CXD2434TQ
—2—
25
24 VSS
XRS
XSHD
XSHP
VDD
XSG
XV1
XV2
XV3
VSS
H2
13 H1
12
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