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MMA8104EG 반도체 회로 부품 판매점

(MMA8xxxEG) Digital Axis Micromachined



Motorola Semiconductor Products 로고
Motorola Semiconductor Products
MMA8104EG 데이터시트, 핀배열, 회로
Freescale Semiconductor
Technical Data
www.DataSheet4U.com
Digital Axis Micromachined
Accelerometer
The MMA81XXEG (Z-axis) and MMA82XXEG (X-axis) are members of
Freescale’s family of DSI 2.0-compatible accelerometers. These devices
incorporate digital signal processing for filtering, trim and data formatting.
Features
• Available in 20g, 40g, 50g, 100g, 150g, and 250g (MMA82XXEG, X-axis) and
40g, 100g, 150g, and 250g (MMA81XXEG, Z-axis). Additional
g-ranges may be available upon request
• 80 customer-accessible OTP bits
• 10-bit digital data output from 8 to 10 bit DSI output
• 6.3 to 30 V supply voltage
• On-chip voltage regulator
• Internal self-test
• Minimal external component requirements
• RoHS compliant (-40 to +125ºC) 16-pin SOIC package
• Automotive AEC-Q100 qualified
• DSI 2.0 Compliant
• Z-axis transducer is overdamped
Typical Applications
• Crash detection (Airbag)
• Impact and vibration monitoring
• Shock detection.
Document Number: MMA81XXEG
Rev 1, 5/2009
MMA81XXEG
MMA82XXEG
SERIES
SINGLE-AXIS
DSI 2.0
ACCELEROMETER
EG SUFFIX (Pb-free)
16-LEAD SOIC
CASE 475-01
PIN CONNECTIONS
N/C
N/C
CREG
VPP/TEST
CFIL
DOUT
VGND/DIN
CLK
1
2
3
4
5
6
7
8
16 VSS
15 VSS
14 BUSRTN
13 BUSIN
12 BUSOUT
11 HCAP
10 VSS
9 CREG
16-PIN SOIC PACKAGE
© Freescale Semiconductor, Inc., 2009. All rights reserved.


MMA8104EG 데이터시트, 핀배열, 회로
www.DataSheet4U.com
Device Name
MMA8225EGR2
MMA8225EG
MMA8215EGR2
MMA8215EG
MMA8210EGR2
MMA8210EG
MMA8205EGR2
MMA8205EG
MMA8204EGR2
MMA8204EG
MMA8202EGR2
MMA8202EG
MMA8125EGR2
MMA8125EG
MMA8115EGR2
MMA8115EG
MMA8110EGR2
MMA8110EG
MMA8104EGR2
MMA8104EG
ORDERING INFORMATION
X-axis g-Level Z-axis g-Level Temperature Range
250 —
-40 to +125°C
250 —
-40 to +125°C
150 —
-40 to +125°C
150 —
-40 to +125°C
100 —
-40 to +125°C
100 —
-40 to +125°C
50 — -40 to +125°C
50 — -40 to +125°C
40 — -40 to +125°C
40 — -40 to +125°C
20 — -40 to +125°C
20 — -40 to +125°C
— 250 -40 to +125°C
— 250 -40 to +125°C
— 150 -40 to +125°C
— 150 -40 to +125°C
— 100 -40 to +125°C
— 100 -40 to +125°C
— 40 -40 to +125°C
— 40 -40 to +125°C
SOIC 16 Package
475-01
475-01
475-01
475-01
475-01
475-01
475-01
475-01
475-01
475-01
475-01
475-01
475-01
475-01
475-01
475-01
475-01
475-01
475-01
475-01
Packaging
Tape & Reel
Tubes
Tape & Reel
Tubes
Tape & Reel
Tubes
Tape & Reel
Tubes
Tape & Reel
Tubes
Tape & Reel
Tubes
Tape & Reel
Tubes
Tape & Reel
Tubes
Tape & Reel
Tubes
Tape & Reel
Tubes
SECTION 1 GENERAL DESCRIPTION
MMA81XXEG/MMA82XXEG family is a satellite accelerometer which is comprised of a single axis, variable capacitance sensing
element with a single channel interface IC. The interface IC converts the analog signal to a digital format which is transmitted in
accordance with the DSI-2.0 specification.
1.1 OVERVIEW
Signal conditioning begins with a Capacitance to Voltage conversion (C to V) followed by a 2-stage switched capacitor amplifier.
This amplifier has adjustable offset and gain trimming and is followed by a low-pass switched capacitor filter with Bessel function.
Offset and gain of the interface IC are trimmed during the manufacturing process. Following the filter the signal passes to the
output stage. The output stage sensitivity incorporates temperature compensation.
The output of the accelerometer signal conditioning is converted to a digital signal by an A/D converter. After this conversion the
resultant digital word is converted to a serial data stream which may be transmitted via the DSI bus. Power for the device is de-
rived from voltage applied to the BUSIN/BUSOUT and VSS pins. Bus voltage is rectified and applied to an external capacitor con-
nected to the HCAP pin. During data transmissions, the device operates from stored charge on the external capacitor. An
integrated regulator supplies fixed voltage to internal circuitry.
A self-test voltage may be applied to the electrostatic deflection plate in the sensing element. Self test voltage is factory trimmed.
Other support circuits include a bandgap voltage reference for the bias sources and the self-test voltage.
A total of 128 bits of One-Time Programmable (OTP) memory, are provided for storage of factory trim data, serial number and
device characteristics. Eighty OTP bits are available for customer programming. These eighty OTP bits may be programmed via
the DSI Bus or through the serial test/trim interface. OTP integrity is verified through continuous parity checking. Separate parity
bits are provided for factory and customer programmed data. In the event that a parity fault is detected, the reserved value of
zero is transmitted in response to a Read Acceleration Data command.
A block diagram illustrating the major elements of the device is shown in Figure 1-1.
MMA81XXEG
2
Sensors
Freescale Semiconductor




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