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PDF LTST-C170KGKT Data sheet ( Hoja de datos )
| Número de pieza | LTST-C170KGKT | |
| Descripción | SMD LED | |
| Fabricantes | Lite-On | |
| Logotipo |  |
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SMD LED
Product Data Sheet
LTST-C170KGKT
Spec No.: DS22-2000-073
Effective Date: 05/06/2005
Revision: G
LITE-ON DCC
RELEASE
BNS-OD-FC001/A4
LITE-ON Technology Corp. / Optoelectronics
No.90,Chien 1 Road, Chung Ho, New Taipei City 23585, Taiwan, R.O.C.
Tel: 886-2-2222-6181 Fax: 886-2-2221-1948 / 886-2-2221-0660
http://www.liteon.com/opto
1 page  
LITE-ON TECHNOLOGY CORPORATION
Property of Lite-On Only
Electrical Optical Characteristics At Ta=25℃
Parameter
Symbol
Part No.
LTST-
Min. Typ. Max. Unit Test Condition
Luminous Intensity
IV C170KGKT 18.0 35.0
mcd
IF = 20mA
Note 1
Viewing Angle
2θ1/2 C170KGKT
130
deg Note 2 (Fig.6)
Peak Emission Wavelength
λP C170KGKT
Dominant Wavelength
λd C170KGKT
574
571
nm
Measurement
@Peak (Fig.1)
nm
IF = 20mA
Note 3
Spectral Line Half-Width
Δλ C170KGKT
15
nm
Forward Voltage
VF C170KGKT
2.0 2.4
V
IF = 20mA
Reverse Current
IR C170KGKT
10 μA
VR = 5V
Capacitance
C C170KGKT
40
PF
VF = 0
f = 1MHZ
Notes: 1. Luminous intensity is measured with a light sensor and filter combination that approximates the
CIE eye-response curve.
2. θ1/2 is the off-axis angle at which the luminous intensity is half the axial luminous intensity.
3. The dominant wavelength, λd is derived from the CIE chromaticity diagram and represents the
single wavelength which defines the color of the device.
Part No. : LTST-C170KGKT
BNS-OD-C131/A4
Page : 4 of 11
5 Page 
LITE-ON TECHNOLOGY CORPORATION
Property of Lite-On Only
ESD-damaged LEDs will exhibit abnormal characteristics such as high reverse leakage current, low forward
voltage, or “ no lightup ” at low currents.
To verify for ESD damage, check for “ lightup ” and Vf of the suspect LEDs at low currents.
The Vf of “ good ” LEDs should be >[email protected] for InGaN product and >1.[email protected] for AlInGaP product.
7. Reliability Test
Classification
Test Item
Test Condition
Operation Life
Ta= Under Room Temperature As Per Data Sheet
Maximum Rating
*Test Time= 1000HRS (-24HRS,+72HRS)*@20mA.
Endurance
Test
High Temperature
High Humidity
Storage
High Temperature
Storage
IR-Reflow In-Board, 2 Times
Ta= 65±5℃,RH= 90～95%
*Test Time= 240HRS±2HRS
Ta= 105±5℃
*Test Time= 1000HRS (-24HRS,+72HRS)
Low Temperature Ta= -55±5℃
Storage
*Test Time=1000HRS (-24HRS,+72H RS)
Reference Standard
MIL-STD-750D:1026
MIL-STD-883D:1005
JIS C 7021:B-1
MIL-STD-202F:103B
JIS C 7021:B-11
MIL-STD-883D:1008
JIS C 7021:B-10
JIS C 7021:B-12
Temperature
Cycling
105℃ ～ 25℃ ～ -55℃ ～ 25℃
30mins 5mins 30mins 5mins
10 Cycles
Thermal
Shock
IR-Reflow In-Board, 2 Times
85 ± 5℃ ～ -40℃ ± 5℃
10mins 10mins 10 Cycles
Environmental
Test
Solder
Resistance
IR-Reflow
Normal Process
IR-Reflow
Pb Free Process
T.sol= 260 ± 5℃
Dwell Time= 10 ± 1secs
Ramp-up rate(183℃ to Peak) +3℃/ second max
Temp. maintain at 125(±25)℃ 120 seconds max
Temp. maintain above 183℃ 60-150 seconds
Peak temperature range 235℃+5/-0℃
Time within 5°C of actual Peak Temperature (tp)
10-30 seconds
Ramp-down rate +6℃/second max
Ramp-up rate(217℃ to Peak) +3℃/ second max
Temp. maintain at 175(±25)℃ 180 seconds max
Temp. maintain above 217℃ 60-150 seconds
Peak temperature range 260℃+0/-5℃
Time within 5°C of actual Peak Temperature (tp)
20-40 seconds
Ramp-down rate +6℃/second max
Solderability
T.sol= 235 ± 5℃
Immersion time 2±0.5 sec
Immersion rate 25±2.5 mm/sec
Coverage ≧95% of the dipped surface
MIL-STD-202F:107D
MIL-STD-750D:1051
MIL-STD-883D:1010
JIS C 7021:A-4
MIL-STD-202F:107D
MIL-STD-750D:1051
MIL-STD-883D:1011
MIL-STD-202F:210A
MIL-STD-750D:2031
JIS C 7021:A-1
MIL-STD-750D:2031.2
J-STD-020C
MIL-STD-750D:2031.2
J-STD-020C
MIL-STD-202F:208D
MIL-STD-750D:2026
MIL-STD-883D:2003
IEC 68 Part 2-20
JIS C 7021:A-2
8. Others
The appearance and specifications of the product may be modified for improvement without prior notice.
Part No. : LTST-C170KGKT
BNS-OD-C131/A4
Page : 10 of 11
11 Page | ||
| Páginas | Total 12 Páginas | |
| PDF Descargar | [ Datasheet LTST-C170KGKT.PDF ] | |
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