PDF 74F194 Data sheet ( Hoja de datos )

Número de pieza	74F194
Descripción	4-bit bidirectional universal shift register
Fabricantes	Philips
Logotipo
Hay una vista previa y un enlace de descarga de 74F194 (archivo pdf) en la parte inferior de esta página. Total 10 Páginas
No Preview Available ! INTEGRATED CIRCUITS 74F194 4-bit bidirectional universal shift register Product specification IC15 Data Handbook 1989 Apr 04 Philips Semiconductors 1 page Philips Semiconductors 4-bit bidirectional universal shift register Product specification 74F194 DC ELECTRICAL CHARACTERISTICS SYMBOL PARAMETER TEST CONDITIONS1 LIMITS MIN TYP2 MAX UNIT VOH High-level output voltage3 VCC = MIN, VIL = MAX ±10%VCC VIH = MIN, IOH = MAX ±5%VCC 2.5 2.7 3.4 V VOL Low-level output voltage VCC = MIN, VIL = MAX ±10%VCC VIH = MIN, IOL = MAX ±5%VCC 0.30 0.50 0.30 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –0.6 mA IOS Short-circuit output current4 VCC = MAX –60 –150 mA ICC Supply current (total)5 VCC = MAX 33 46 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Output High state will change to Low stat if an external voltage of less than 0.0V is applied. 4. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 5. With all outputs open, Di inputs grounded and a 4.5V applied to S0, S1, MR and the serial inputs, ICC is tested with a momentary ground, then 4.5V applied to CP. AC ELECTRICAL CHARACTERISTICS SYMBOL PARAMETER fMAX tPLH tPHL tPHL Maximum clock frequency Propagation delay CP to Qn Propagation delay MR to Qn TEST CONDITION Waveform 1 Waveform 1 Waveform 2 LIMITS VCC = +5.0V Tamb = +25°C CL = 50pF, RL = 500Ω VCC = +5.0V ± 10% Tamb = 0°C to +70°C CL = 50pF, RL = 500Ω MIN TYP MAX MIN MAX 105 150 90 3.5 5.2 7.0 3.5 5.5 7.0 3.5 3.5 8.0 8.0 4.5 8.6 12.0 4.5 14.0 UNIT MHz ns ns AC SETUP REQUIREMENTS SYMBOL PARAMETER tS(H) tS(L) th(H) th(L) tS(H) tS(L) th(H) th(L) tW(H) tW(L) tREC Setup time, High or Low Dn, DSL, DSR to CP Hold time, High or Low Dn, DSL, DSR to CP Setup time, High or Low Sn to CP Hold time, High or Low Sn to CP CP Pulse width, High MR Pulse width, Low Recovery time, MR to CP TEST CONDITION Waveform 3 Waveform 3 Waveform 3 Waveform 3 Waveform 1 Waveform 2 Waveform 2 LIMITS VCC = +5.0V Tamb = +25°C CL = 50pF, RL = 500Ω VCC = +5.0V ± 10% Tamb = 0°C to +70°C CL = 50pF, RL = 500Ω MIN TYP MAX MIN MAX 4.0 4.0 4.0 4.0 0 1.0 0 1.0 8.0 9.0 8.0 8.0 00 00 5.0 5.5 5.0 5.0 7.0 8.0 UNIT ns ns ns ns ns ns ns April 4, 1989 5 5 Page

Páginas	Total 10 Páginas
PDF Descargar	[ Datasheet 74F194.PDF ]

Hoja de datos destacado

Número de pieza	Descripción	Fabricantes
74F190	Up/Down Decade Counter with Preset and Ripple Clock	Fairchild
74F190	Up/Down Decade Counter with Preset and Ripple Clock	National
74F190	Up/Down Decade Counter	National Semiconductor
74F190	Up/Down Decade Counter with Preset and Ripple Clock (Rev. A)	Texas Instruments

Número de pieza	Descripción	Fabricantes
SLA6805M	High Voltage 3 phase Motor Driver IC.	Sanken
SDC1742	12- and 14-Bit Hybrid Synchro / Resolver-to-Digital Converters.	Analog Devices

DataSheet.es es una pagina web que funciona como un repositorio de manuales o hoja de datos de muchos de los productos más populares,
permitiéndote verlos en linea o descargarlos en PDF.

DataSheet.es | 2020 | Privacy Policy | Contacto | Buscar