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PDF MN100314-X Data sheet ( Hoja de datos )
| Número de pieza | MN100314-X | |
| Descripción | LOW POWER QUINT DIFFERENTIAL LINE RECEIVER | |
| Fabricantes | National Semiconductor | |
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MN100314-X REV 1A0
MILITARY DATA SHEET
Original Creation Date: 10/30/95
Last Update Date: 08/28/96
Last Major Revision Date: 08/21/96
LOW POWER QUINT DIFFERENTIAL LINE RECEIVER
General Description
The 100314 is a monolithic quint differential line receiver with emitter-follower
outputs. An internal reference supply (Vbb) is available for single-ended reception.
When used in single-ended operation, the only mode allowed is to connect the complementary
inputs to Vbb. Unlike other F100K ECL devices, the inputs do not have input pull-down
resistors. Active current sources provide common-mode rejection of 1.0V in either the
positive or negative direction. A defined output state exists if both inverting and
non-inverting inputs are at the same potential between Vee and Vcc. The defined state is
logic HIGH on the Oa-Oe outputs.
Industry Part Number
100314
Prime Die
F314
NS Part Numbers
100314DMQB
100314FMQB
100314J-QMLV
100314W-QMLV
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
1 Static tests at
2 Static tests at
3 Static tests at
4 Dynamic tests at
5 Dynamic tests at
6 Dynamic tests at
7 Functional tests at
8A Functional tests at
8B Functional tests at
9 Switching tests at
10 Switching tests at
11 Switching tests at
Temp ( oC)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
1
1 page  
MN100314-X REV 1A0
MILITARY DATA SHEET
Electrical Characteristics
AC PARAMETERS
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: Vee Range: -4.2V to -5.7V, VCC=VCCA=GND, LOADING: 50 Ohms To -2.0V
SYMBOL
PARAMETER
CONDITIONS
tPLH/tPHL Propagation Delay Vee= -4.2/-5.7V
NOTES
PIN-
NAME
MIN
2, 4 Dn/Dn t 0.6
o On/On
MAX
2.2
UNIT
ns
SUB-
GROUPS
9
2, 4 Dn/Dn t 0.6 2.7 ns 10
o On/On
2, 4 Dn/Dn t 0.4 2.3 ns 11
o On/On
tTLH/tTHL Transition Time Vee= -4.2/-5.7V
6 On/On 0.2 1.4 ns 9, 10,
11
Note 1:
Note 2:
Note 3:
Note 4:
Note 5:
Note 6:
Note 7:
Screen tested 100% on each device at -55 C, +25 C and +125 C temp., subgroups 1, 2,
3, 7 & 8.
For QB devices, screen tested 100% on each device at +25C temperature only, subgroup
A9. For QMLV devices, screen tested 100% on each device at +25C, +125C & -55C
temperature, subgroups A9, 10 & 11.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25 C, +125 C & -55 C temp.,
subgroups A1, 2, 3, 7 & 8.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25 C, subgroup A9, and at
+125 C & -55 C temp., subgroups A10 & 11.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25 C temp. only, subgroup
A9.
Not tested at +25 C, +125 C & -55 C temp. (DESIGN CHARACTERIZATION DATA).
Guaranteed by applying specified input condition and testing VOH/VOL.
5
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