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Fairchild Semiconductor |
Advanced Power MOSFET
IRFW/I520A
FEATURES
www.DataSheet4U.com
Avalanche Rugged Technology
Rugged Gate Oxide Technology
Lower Input Capacitance
Improved Gate Charge
Extended Safe Operating Area
175ΟC Operating Temperature
Lower Leakage Current : 10 µA (Max.) @ VDS = 100V
Lower RDS(ON) : 0.155 Ω(Typ.)
Absolute Maximum Ratings
Symbol
VDSS
ID
IDM
VGS
EAS
IAR
EAR
dv/dt
PD
TJ , TSTG
TL
Characteristic
Drain-to-Source Voltage
Continuous Drain Current (TC=25 ΟC)
Continuous Drain Current (TC=100 ΟC)
Drain Current-Pulsed
O1
Gate-to-Source Voltage
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Total Power Dissipation (TA=25ΟC ) *
Total Power Dissipation (TC=25 ΟC)
Linear Derating Factor
O2
O1
O1
O3
Operating Junction and
Storage Temperature Range
Maximum Lead Temp. for Soldering
Purposes, 1/8”from case for 5-seconds
BVDSS = 100 V
RDS(on) = 0.2 Ω
ID = 9.2 A
D2-PAK I2-PAK
2
1
3
1
2
3
1. Gate 2. Drain 3. Source
Value
100
9.2
6.5
37
+_ 20
113
9.2
4.5
6.5
3.8
45
0.3
- 55 to +175
300
Units
V
A
A
V
mJ
A
mJ
V/ns
W
W
W/ΟC
ΟC
Thermal Resistance
Symbol
Characteristic
Typ.
RθJC
R θ JA
RθJA
Junction-to-Case
Junction-to-Ambient *
Junction-to-Ambient
--
--
--
* When mounted on the minimum pad size recommended (PCB Mount).
Max.
3.31
40
62.5
Units
ΟC /W
Rev. B
©1999 Fairchild Semiconductor Corporation
IRFW/I520A
N-CHANNEL
POWER MOSFET
Electrical Characteristics (TC=25ΟC unless otherwise specified)
www.DataSheet4U.com
Symbol
BVDSS
∆BV/ ∆TJ
VGS(th)
IGSS
IDSS
RDS(on)
gfs
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
Qg
Qgs
Qgd
Characteristic
Drain-Source Breakdown Voltage
Breakdown Voltage Temp. Coeff.
Gate Threshold Voltage
Gate-Source Leakage , Forward
Gate-Source Leakage , Reverse
Drain-to-Source Leakage Current
Static Drain-Source
On-State Resistance
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain(“Miller”) Charge
Min. Typ. Max. Units
Test Condition
100 --
-- 0.12
2.0 --
--
--
4.0
V VGS=0V,ID=250 µA
V/ΟC ID=250µA See Fig 7
V VDS=5V,ID=250 µA
-- -- 100 nA VGS=20V
-- -- -100
VGS=-20V
-- -- 10
VDS=100V
-- -- 100 µ A VDS=80V,TC=150ΟC
-- -- 0.2 Ω VGS=10V,ID=4.6A
O4
-- 6.35 --
Ω VDS=40V,ID=4.6A
O4
-- 370 480
-- 95 110 pF VGS=0V,VDS=25V,f =1MHz
See Fig 5
-- 38 45
-- 14 40
-- 14 40
VDD=50V,ID=9.2A,
-- 36 90 ns RG=18Ω
See Fig 13
-- 28 70
O4 O5
-- 16 22
VDS=80V,VGS=10V,
-- 2.7 -- nC ID=9.2A
-- 7.8 --
See Fig 6 & Fig 12 O4 O5
Source-Drain Diode Ratings and Characteristics
Symbol
IS
ISM
VSD
trr
Qrr
Characteristic
Continuous Source Current
Pulsed-Source Current
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Min. Typ. Max. Units
Test Condition
--
O1 --
-- 9.2
Integral reverse pn-diode
A
-- 37
in the MOSFET
O4 -- -- 1.5 V TJ=25ΟC,IS=9.2A,VGS=0V
-- 98 --
-- 0.34 --
ns TJ=25ΟC ,IF=9.2A
µ C diF/dt=100A/ µs
O4
Notes ;
O1 Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature
O2 L=2mH, IAS=9.2A, VDD=25V, RG=27Ω , Starting TJ =25oC
O3 ISD <_ 9.2A, di/dt <_ 300A/µs, VDD <_ BVDSS , Starting TJ =25 oC
O4 Pulse Test : Pulse Width = 250 µs, Duty Cycle <_2%
O5 Essentially Independent of Operating Temperature
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