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Fairchild Semiconductor |
August 1989
Revised August 2000
100304
Low Power Quint AND/NAND Gate
General Description
The 100304 is monolithic quint AND/NAND gate. The
Function output is the wire-NOR of all five AND gate out-
puts. All inputs have 50 kΩ pull-down resistors.
Features
s Low Power Operation
s 2000V ESD protection
s Pin/function compatible with 100104
s Voltage compensated operating range = −4.2V to −5.7V
s Available to industrial grade temperature range
(PLCC package only)
Ordering Code:
Order Number Package Number
Package Description
100304PC
N24E
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide
100304QC
V28A
28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square
100304QI
V28A
28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square
Industrial Temperature Range (−40°C to +85°C)
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Logic Symbol
Connection Diagrams
24-Pin DIP
Pin Descriptions
Pin Names
Description
Dna–Dne
F
Data Inputs
Function Output
Oa–Oe
Oa–Oe
Data Outputs
Complementary Data Outputs
Logic Equation
F = (D1a • D2a) + (D1b • D2b) + (D1c • D2c) +
(D1d • D2d) + (D1e • D2e).
© 2000 Fairchild Semiconductor Corporation DS010581
28-Pin PLCC
www.fairchildsemi.com
Absolute Maximum Ratings(Note 1)
Storage Temperature (TSTG)
−65°C to +150°C
Maximum Junction Temperature (TJ)
+150°C
VEE Pin Potential to Ground Pin
−7.0V to +0.5V
Input Voltage (DC)
VEE to +0.5V
Output Current (DC Output HIGH)
−50 mA
ESD (Note 2)
≥2000V
Commercial Version
Recommended Operating
Conditions
Case Temperature (TC)
Commercial
0°C to +85°C
Industrial
−40°C to +85°C
Supply Voltage (VEE)
−5.7V to −4.2V
Note 1: The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum rating.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
DC Electrical Characteristics (Note 3)
VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = 0°C to +85°C
Symbol
Parameter
Min
Typ
Max
Units
Conditions
VOH
VOL
VOHC
VOLC
VIH
Output HIGH Voltage
Output LOW Voltage
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
−1025
−1830
−1035
−1165
−955
−1705
−870
−1620
−1610
−870
mV VIN =VIH (Max)
mV or VIL (Min)
mV VIN = VIH(Min)
mV or VIL (Max)
mV Guaranteed HIGH Signal
for All Inputs
Loading with
50Ω to −2.0V
Loading with
50Ω to −2.0V
VIL Input LOW Voltage
−1830
−1475
mV Guaranteed LOW Signal
for All Inputs
IIL Input LOW Current
0.50
µA VIN = VIL (Min)
IIH Input High Current
D2a–D2e
250 µA VIN = VIH(Max)
D1a–D1e
350
IEE Power Supply Current
−69 −43 −30 mA Inputs open
Note 3: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-
sen to guarantee operation under “worst case” conditions.
DIP AC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND
Symbol
Parameter
tPLH Propagation Delay
tPHL
Dna–Dne to O, O
tPLH Propagation Delay
tPHL Data to F
tTLH Transition Time
tTHL 20% to 80%, 80% to 20%
TC = 0°C
Min Max
0.40 1.75
1.00 2.60
0.35 1.20
TC = +25°C
Min Max
0.40 1.65
1.00 2.60
0.35 1.20
TC = +85°C
Min Max
0.40 1.75
1.15 3.20
0.35 1.20
Units
Conditions
ns
ns Figures 1, 2
ns
PLCC AC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND
Symbol
Parameter
tPLH Propagation Delay
tPHL
Dna–Dne to O, O
tPLH Propagation Delay
tPHL Data to F
tTLH Transition Time
tTHL 20% to 80%, 80% to 20%
TC = 0°C
Min Max
0.40 1.55
1.00 2.40
0.35 1.10
TC = +25°C
Min Max
0.40 1.45
1.00 2.40
0.35 1.15
TC = +85°C
Min Max
0.40 1.55
1.15 3.00
0.35 1.10
Units
Conditions
ns
ns Figures 1, 2
ns
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