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PDF 74ACTQ827SC Data sheet ( Hoja de datos )

Número de pieza 74ACTQ827SC
Descripción Quiet Seriesa 10-Bit Buffer/Line Driver with 3-STATE Outputs
Fabricantes Fairchild Semiconductor 
Logotipo Fairchild Semiconductor Logotipo



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March 1990
Revised December 1998
74ACTQ827
Quiet Series10-Bit Buffer/Line Driver
with 3-STATE Outputs
General Description
The ACTQ827 10-bit bus buffer provides high performance
bus interface buffering for wide data/address paths or
buses carrying parity. The 10-bit buffers have NOR output
enables for maximum control flexibility. The ACTQ827 uti-
lizes Fairchild Quiet Seriestechnology to guarantee quiet
output switching and improved dynamic threshold perfor-
mance. FACT Quiet Seriesfeatures GTOoutput control
and undershoot corrector in addition to a split ground bus
for superior performance.
Features
s Guaranteed simultaneous switching noise level and
dynamic threshold performance
s Guaranteed pin-to-pin skew AC performance
s Inputs and outputs on opposite sides of package allow
easy interface with microprocessors
s Improved latch-up immunity
s Outputs source/sink 24 mA
s Functionally and pin-compatible to AMD’s AM29827
s Has TTL-compatible inputs
Ordering Code:
Order Number Package Number
Package Description
74ACTQ827SC
M24B
24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300” Wide Body
74ACTQ827SPC
N24C
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-100, 0.300” Wide
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.
Logic Symbols
Connection Diagram
Pin Assignment
for DIP and SOIC
IEEE/IEC
Pin Descriptions
Pin Names
OE1, OE2
D0–D9
O0–O9
Description
Output Enable
Data Inputs
Data Outputs
FACT, Quiet Series, FACT Quiet Seriesand GTOare trademarks of Fairchild Semiconductor Corporation.
© 1999 Fairchild Semiconductor Corporation DS010687.prf
www.fairchildsemi.com

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74ACTQ827SC pdf
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical
to the accuracy and repeatability of the tests. The following
is a brief description of the setup used to measure the
noise characteristics of FACT.
Equipment:
Hewlett Packard Model 8180A Word Generator
PC-163A Test Fixture
Tektronics Model 7854 Oscilloscope
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF,
500.
2. Deskew the HFS generator so that no two channels
have greater than 150 ps skew between them. This
requires that the oscilloscope be deskewed first. It is
important to deskew the HFS generator channels
before testing. This will ensure that the outputs switch
simultaneously.
3. Terminate all inputs and outputs to ensure proper load-
ing of the outputs and that the input levels are at the
correct voltage.
4. Set the HFS generator to toggle all but one output at a
frequency of 1 MHz. Greater frequencies will increase
DUT heating and effect the results of the measure-
ment.
5. Set the word generator input levels at 0V LOW and 3V
HIGH for ACT devices and 0V LOW and 5V HIGH for
AC devices. Verify levels with an oscilloscope.
VOLP/VOLV and VOHP/VOHV:
• Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually be
the furthest from the ground pin. Monitor the output volt-
ages using a 50coaxial cable plugged into a standard
SMB type connector on the test fixture. Do not use an
active FET probe.
• Measure VOLP and VOLV on the quiet output during the
worst case transition for active and enable. Measure
VOHP and VOHV on the quiet output during the worst
case active and enable transition.
• Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
VILD and VIHD:
• Monitor one of the switching outputs using a 50coaxial
cable plugged into a standard SMB type connector on
the test fixture. Do not use an active FET probe.
• First increase the input LOW voltage level, VIL, until the
output begins to oscillate or steps out a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds VIL limits, or on output HIGH levels that
exceed VIH limits. The input LOW voltage level at which
oscillation occurs is defined as VILD.
• Next decrease the input HIGH voltage level, VIH, until
the output begins to oscillate or steps out a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds VIL limits, or on output HIGH levels that
exceed VIH limits. The input HIGH voltage level at which
oscillation occurs is defined as VIHD.
• Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
Note 9: VOHV and VOLP are measured with respect to ground reference.
Note 10: Input pulses have the following characteristics: f = 1 MHz,
tr = 3 ns, tf = 3 ns, skew < 150 ps.
FIGURE 1. Quiet Output Noise Voltage Waveforms
FIGURE 2. Simultaneous Switching Test Circuit
5 www.fairchildsemi.com

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