PO54G00A 반도체 회로 부품 판매점
GHz Logic
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 Potatosemi |
PO54G00A, PO74G00A
QUADRUPLE 2-INPUT POSITIVE-NAND GATE
54, 74 Series GHz Logic
09/12/07
FEATURES:
DESCRIPTION:
. Patented technology
. Specified From –40°C to 85°C, –40°C to 125°C,
and –55°C to 125°C
. Operating frequency up to 1.125GHz with 2pf load
. Operating frequency up to 750MHz with 5pf load
www.DataSheet4U.com . Operating frequency up to 350MHz with 15pf load
. VCC Operates from 1.65V to 3.6V
. Propagation delay < 1.5ns max with 15pf load
. Low input capacitance: 4pf typical
. Latch-Up Performance Exceeds 250 mA Per
JESD 17
. ESD Protection Exceeds JESD 22
. 2000-VHuman-BodyModel (A114-A)
. 200-VMachineModel (A115-A)
. 1000-VCharged-DeviceModel (C101)
. Available in 14pin 150mil wide SOIC package
. Available in 14pin Ceramic Dual Flatpack
. Available in 20pin Leadless Ceramic Chip Carrier
Potato Semiconductor’s PO74G00A is designed for
world top performance using submicron CMOS
technology to achieve 1.125GHz TTL/CMOS output
frequency with less than 1.5ns propagation delay.
This quadruple 2-input positive-NAND gate is
designed for 1.65-V to 3.6-V VCC operation.
The PO74G00A performs the Boolean function
Y= A · B or Y= A + B in positive logic.
Inputs can be driven from either 3.3V or 5V devices.
This feature allows the use of these devices as
translators in a mixed 3.3V/5V system environment.
Pin Configuration
1A
1B
1Y
2A
2B
2Y
GND
1
2
3
4
5
6
7
14 V CC
13 4B
12 4A
11 4Y
10 3B
9 3A
8 3Y
1Y
3 2 1 20 19
4 18
4A
NC 5
17 NC
2A 6
16 4Y
NC 7
15 NC
2B 8
14 3B
9 10 11 12 13
Pin Description
INPUTS
AB
HH
LX
XL
OUTPUT
Y
L
H
H
Logic Block Diagram
A
Y
B
1
Copyright © 2005-2007, Potato Semiconductor Corporation
PO54G00A, PO74G00A
QUADRUPLE 2-INPUT POSITIVE-NAND GATE
54, 74 Series GHz Logic
09/12/07
Maximum Ratings
Description
Max
Storage Temperature
www.DataSheet4U.com Operation Temperature
-65 to 150
-55 to 125
Operation Voltage
-0.5 to +4.6
Input Voltage
-0.5 to +5.5
Output Voltage
-0.5 to Vcc+0.5
Unit
°C
°C
V
V
V
Note:
stresses greater than listed under
Maximum Ratings may cause
permanent damage to the device. This
is a stress rating only and functional
operation of the device at these or any
other conditions above those indicated
in the operational sections of this
specification is not implied. Exposure
to absolute maximum rating conditions
for extended periods may affect
reliability specification is not implied.
DC Electrical Characteristics
Symbol
Description
Test Conditions
VOH
VOL
VIH
VIL
IIH
IIL
VIK
Output High voltage Vcc=3V Vin=VIH or VIL, IOH= -12mA
Output Low voltage Vcc=3V Vin=VIH or VIL, IOH=12mA
Input High voltage Guaranteed Logic HIGH Level (Input Pin)
Input Low voltage
Guaranteed Logic LOW Level (Input Pin)
Input High current Vcc = 3.6V and Vin = 5.5V
Input Low current
Vcc = 3.6V and Vin = 0V
Clamp diode voltage Vcc = Min. And IIN = -18mA
Min Typ Max Unit
2.4 3 - V
- 0.3 0.5 V
2 - 5.5 V
-0.5 - 0.8 V
- - 5 uA
- - -5 uA
- -0.7 -1.2 V
Notes:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 3.3V, 25 °C ambient.
3. This parameter is guaranteed but not tested.
4. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
5. VoH = Vcc – 0.6V at rated current
2
Copyright © 2005-2007, Potato Semiconductor Corporation
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