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Samtec |
Project Number: NA
Tracking Code: 0212--0640
Requested by: W. Ouyang
Date: 3/22/02
Product Rev: See Front Page
Part #: See Front Page
Lot #: 03/18/02
Tech: G.Lewis
Eng: J. Tozier
Part description: 0.8mm, 0.635mm, 0.5mm Quiet & Basic High Speed Products
Qty to test: 210
Test Start: 3/29/02
Test Completed: 6/6/02
Mating - Unmating Summary Report
PARTS DESCRIPTIONS
TERMINAL SIDE
BTE-020-01-F-D-A
BTE-060-01-F-D-A
BTE-120-01-F-D-A
REV: Q
BTS-025-01-F-D-A
BTS-075-01-F-D-A
BTS-150-01-F-D-A
REV: B
BTH-030-01-F-D-A
BTH-090-01-F-D-A
BTH-150-01-F-D-A
REV: K
MIT-019-01-F-D-A
MIT-076-01-F-D-A
MIT-133-01-F-D-A
REV: C
QTE-020-01-F-D-A
QTE-060-01-F-D-A
QTE-100-01-F-D-A
REV: X
QTS-025-01-F-D-A
QTS-075-01-F-D-A
QTS-125-01-F-D-A
m REV: A
o QTH-030-01-F-D-A
.c QTH-090-01-F-D-A
u QTH-150-01-F-D-A
t4 REV: N
www.datasheeFile: J:\QA LAB\Test Programs\TC0106-0334\tc0106—0334.doc
SOCKET SIDE
BSE-020-01-F-D-A
BSE-060-01-F-D-A
BSE-120-01-F-D-A
REV: D
BSS-025-01-F-D-A
BSS-075-01-F-D-A
BSS-150-01-F-D-A
REV: A
BSH-030-01-F-D-A
BSH-090-01-F-D-A
BSH-150-01-F-D-A
REV: D
MIS-133-01-F-D-A
MIS-019-01-F-D-A
MIS-076-01-F-D-A
REV: C
QSE-020-01-F-D-A
QSE-060-01-F-D-A
QSE-100-01-F-D-A
REV: R
QSS-025-01-F-D-A
QSS-075-01-F-D-A
QSS-125-01-F-D-A
REV: B
QSH-030-01-F-D-A
QSH-090-01-F-D-A
QSH-150-01-F-D-A
REV: F
Form 01 Rev 03
Page 1 of 18
Project Number: NA
Tracking Code: 0212--0640
Requested by: W. Ouyang
Date: 3/22/02
Product Rev: See Front Page
Part #: See Front Page
Lot #: 03/18/02
Tech: G.Lewis
Eng: J. Tozier
Part description: 0.8mm, 0.635mm, 0.5mm Quiet & Basic High Speed Products
Qty to test: 210
Test Start: 3/29/02
Test Completed: 6/6/02
CERTIFICATION
All instruments and measuring equipment were calibrated to National Institute for Standards and Technology (NIST)
traceable standards according to IS0 10012-l and ANSI/NCSL 2540-1, as applicable.
All contents contained herein are the property of Samtec. No portion of this report, in part or in full shall be
reproduced without prior written approval of Samtec.
SCOPE
To perform the following tests: Mating - Unmating
APPLICABLE DOCUMENTS
Standards: EIA Publication 364
TEST SAMPLES AND PREPARATION
1) All materials were manufactured in accordance with the applicable product specification.
2) All test samples were identified and encoded to maintain traceability throughout the test sequences.
3) After soldering, the parts to be used for LLCR testing were cleaned according to TLWI-0001:
a) Sample test boards are to be ultrasonically cleaned after test lead attachment, preparation and/or
soldering using the following process.
b) Immerse the sample test boards into the Branson 3510 cleaner which contains Kyzen Ionox
HC1 (or equivalent) cleaning solution with the following conditions:
i) Temperature:
55° C+/- 5° C
ii) Frequency:
40 KHz
iii) Immersion Time:
5 to 10 Minutes
c) Sample test boards are then slowly removed and placed into the Branson 3510 cleaner which
contains deionized water with the following conditions:
i) Temperature:
55° C +/- 5° C
ii) Frequency:
40 KHz
iii) Immersion Time:
5 to 10 Minutes
d) Sample test boards are then removed and placed in a beaker, on a hot plate with a magnetic
stirrer containing deionized water warmed to 55° C +/- 5° C for 1/2 to 1 minute (Use 55° C as
target)
e) Upon removal, the sample test boards are then rinsed for 1/2 to 1 minute in room temperature
free flowing deionized water.
f) After the final rinse, the sample test boards are to be dried in an air-circulating oven for 10 to 15
minutes at 50° C +/- 5° C (Use 50° C as target)
g) Sample test boards are then allowed to set and recover to room ambient condition prior to
testing.
4) Parts not intended for testing LLCR and DWV/IR are visually inspected and cleaned if necessary.
5) Any additional preparation will be noted in the individual test procedures.
File: J:\QA LAB\Test Programs\TC0106-0334\tc0106—0334.doc
Form 01 Rev 03
Page 2 of 18
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