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PDF MA126 Data sheet ( Hoja de datos )

Número de pieza MA126
Descripción Low G Micromachined Accelerometer
Fabricantes Motorola Semiconductors 
Logotipo Motorola Semiconductors Logotipo



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Freescale Semiconductor
Technical Data
Low G
Micromachined Accelerometer
The MMA series of silicon capacitive, micromachined accelerometers
features signal conditioning, a 2--pole low pass filter and temperature
compensation. Zero--g offset full scale span and filter cut--off are factory set and
require no external devices. A full system self--test capability verifies system
functionality.
Features
Integral Signal Conditioning
Linear Output
2nd Order Bessel Filter
Calibrated Self--test
EPROM Parity Check Status
Transducer Hermetically Sealed at Wafer Level for Superior Reliability
Robust Design, High Shock Survivability
Typical Applications
Vibration Monitoring and Recording
Appliance Control
Mechanical Bearing Monitoring
Computer Hard Drive Protection
Computer Mouse and Joysticks
Virtual Reality Input Devices
Sports Diagnostic Devices and Systems
ORDERING INFORMATION
Device
Temperature Range
MMA1260D
--40 to +105°C
Case No.
Case 475--01
Package
SOIC--16
MMA1260D
Rev. 1, 10/2004
MMA1260D
MMA1260D: Z AXIS SENSITIVITY
MICROMACHINED
ACCELEROMETER
±1.5g
16
9
1
8
16 LEAD SOIC
CASE 475--01
VSS
VSS
VSS
VOUT
STATUS
VDD
VSS
ST
Pin Assignment
1 16
2 15
3 14
4 13
5 12
6 11
7 10
89
N/C
N/C
N/C
N/C
N/C
N/C
N/C
N/C
SIMPLIFIED ACCELEROMETER FUNCTIONAL BLOCK DIAGRAM
G--CELL
SENSOR
INTEGRATOR
GAIN
FILTER
TEMP COMP
& GAIN
VDD
VOUT
ST
SELF--TEST
CONTROL LOGIC &
EPROM TRIM CIRCUITS
OSCILLATOR
CLOCK GEN.
VSS
STATUS
Figure 1. Simplified Accelerometer Functional Block Diagram
REV 1
© Freescale Semiconductor, Inc., 2004. All rights reserved.
Sensor Device Data
Freescale Semiconductor
MMA1260D
1

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MA126 pdf
BASIC CONNECTIONS
VSS
VSS
VSS
VOUT
STATUS
VDD
VSS
ST
1
2
3
4
5
6
7
8
16 N/C
15 N/C
14 N/C
13 N/C
12 N/C
11 N/C
10 N/C
9 N/C
Figure 4. Pinout Description
Pin No.
1 thru 3
Pin Name
VSS
4 VOUT
5 STATUS
6 VDD
7 VSS
8 ST
9 thru 13 Trim pins
14 thru 16
Description
Redundant connections to the internal
VSS and may be left unconnected.
Output voltage of the accelerometer.
Logic output pin used to indicate fault.
The power supply input.
The power supply ground.
Logic input pin used to initiate self--
test.
Used for factory trim.
Leave unconnected.
No internal connection.
Leave unconnected.
VDD
LOGIC
INPUT
C1
0.1 µF
MMA1260D
5
8 ST
R1
6 VDD
VOUT 4 1 k
7 VSS
C2
0.1 µF
STATUS
OUTPUT
SIGNAL
Figure 5. SOIC Accelerometer with Recommended
Connection Diagram
PCB Layout
STATUS
P1
ST P0
VOUT
VSS
VDD
R A/D IN
1 kC 0.1 µF
C 0.1 µF
VRH
C 0.1 µF
VSS
C 0.1 µF
VDD
POWER SUPPLY
Figure 6. Recommended PCB Layout for Interfacing
Accelerometer to Microcontroller
NOTES:
Use a 0.1 µF capacitor on VDD to decouple the power
source.
Physical coupling distance of the accelerometer to the mi-
crocontroller should be minimal.
Place a ground plane beneath the accelerometer to reduce
noise, the ground plane should be attached to all internal
VSS terminals shown in Figure 4.
Use an RC filter of 1 kand 0.1 µF on the output of the ac-
celerometer to minimize clock noise (from the switched
capacitor filter circuit).
PCB layout of power and ground should not couple power
supply noise.
Accelerometer and microcontroller should not be a high
current path.
A/D sampling rate and any external power supply switching
frequency should be selected such that they do not inter-
fere with the internal accelerometer sampling frequency.
This will prevent aliasing errors.
Sensor Device Data
Freescale Semiconductor
MMA1260D
5

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