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Número de pieza | FDC6303 | |
Descripción | Digital FET/ Dual N-Channel | |
Fabricantes | Fairchild Semiconductor | |
Logotipo | ||
Hay una vista previa y un enlace de descarga de FDC6303 (archivo pdf) en la parte inferior de esta página. Total 4 Páginas | ||
No Preview Available ! August 1997
FDC6303N
Digital FET, Dual N-Channel
General Description
These dual N-Channel logic level enhancement mode field
effect transistors are produced using Fairchild's proprietary,
high cell density, DMOS technology. This very high density
process is especially tailored to minimize on-state
resistance. This device has been designed especially for
low voltage applications as a replacement for digital
transistors in load switching applications. Since bias
resistors are not required this one N-Channel FET can
replace several digital transistors with different bias
resistors like the IMHxA series.
Features
25 V, 0.68 A continuous, 2 A Peak.
RDS(ON) = 0.6 Ω @ VGS = 2.7 V
RDS(ON) = 0.45 Ω @ VGS= 4.5 V.
Very low level gate drive requirements allowing direct
operation in 3V circuits. VGS(th) < 1.5 V.
Gate-Source Zener for ESD ruggedness.
>6kV Human Body Model
Replace multiple NPN digital transistors (IMHxA series)
with one DMOS FET.
SOT-23
SuperSOTTM-6
SuperSOTTM-8
Mark: .303
SO-8
SOT-223
SOIC-16
43
52
61
Absolute Maximum Ratings TA = 25°C unless otherwise noted
Symbol Parameter
VDSS Drain-Source Voltage
VGSS Gate-Source Voltage
ID Drain Current
- Continuous
- Pulsed
PD Maximum Power Dissipation
(Note 1a)
(Note 1b)
TJ,TSTG
ESD
Operating and Storage Temperature Range
Electrostatic Discharge Rating MIL-STD-883D
Human Body Model (100pf / 1500 Ohm)
THERMAL CHARACTERISTICS
RθJA Thermal Resistance, Junction-to-Ambient (Note 1a)
RθJC Thermal Resistance, Junction-to-Case
(Note 1)
© 1997 Fairchild Semiconductor Corporation
FDC6303N
25
8
0.68
2
0.9
0.7
-55 to 150
6.0
140
60
Units
V
V
A
W
°C
kV
°C/W
°C/W
FDC6303N Rev.C
1 page |
Páginas | Total 4 Páginas | |
PDF Descargar | [ Datasheet FDC6303.PDF ] |
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