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Fairchild Semiconductor |
BD234/236/238
Medium Power Linear and Switching
Applications
• Complement to BD 233/235/237 respectively
PNP Epitaxial Silicon Transistor
Absolute Maximum Ratings TC=25°C unless otherwise noted
Symbol
Parameter
VCBO
Collector-Base Voltage
: BD234
: BD236
: BD238
VCEO
Collector-Emitter Voltage
: BD234
: BD236
: BD238
VCER
Collector-Emitter Voltage
: BD234
: BD236
: BD238
VEBO
IC
ICP
PC
TJ
TSTG
Emitter-Base Voltage
Collector Current (DC)
*Collector Current (Pulse)
Collector Dissipation (TC=25°C)
Junction Temperature
Storage Temperature
1 TO-126
1. Emitter 2.Collector 3.Base
Value
- 45
- 60
- 100
- 45
- 60
- 80
- 45
- 60
- 100
-5
-2
-6
25
150
- 65 ~ 150
Units
V
V
V
V
V
V
V
V
V
V
A
A
W
°C
°C
Electrical Characteristics TC=25°C unless otherwise noted
Symbol
Parameter
Test Condition
Min. Typ. Max. Units
VCEO(sus)
* Collector-Emitter Sustaining Voltage
: BD234
: BD236
: BD238
IC = - 100mA, IB = 0
- 45
- 60
- 80
V
V
V
ICBO
IEBO
hFE
Collector Cut-off Current
: BD234
: BD236
: BD238
Emitter Cut-off Current
* DC Current Gain
VCE(sat)
* Collector-Emitter Saturation Voltage
VBE(on)
* Base-Emitter ON Voltage
fT Current Gain Bandwidth Product
* Pulse Test: PW=300µs, duty Cycle=1.5% Pulsed
VCB = - 45V, IE = 0
VCB = - 60V, IE = 0
VCB = - 100V, IE = 0
VEB = - 5V, IC = 0
VCE = - 2V, IC = - 150mA
VCE = - 2V, IC = - 1A
IC = - 1A , IB = - 0.1A
VCE = - 2V, IC = - 1A
VCE = - 10V, IC = -250mA
40
25
3
- 100
- 100
- 100
-1
µA
µA
µA
mA
- 0.6
- 1.3
V
V
MHz
©2000 Fairchild Semiconductor International
Rev. A, February 2000
Typical Characteristics
-1000
-100
VCE = -2V
-10
-1
-0.01
-0.1 -1
IC[A], COLLECTOR CURRENT
Figure 1. DC current Gain
-10
-10
IC MAX. (Pulsed)
IC MAX. (Continuous)
-1
DC
10µs
-0.1
-1
-10
VCE[V], COLLECTOR-EMITTER VOLTAGE
-100
Figure 3. Safe Operating Area
-10
IC = 10 IB
-1 VBE(sat)
VCE(sat)
-0.1
-0.01
-0.1
-1
IC[A], COLLECTOR CURRENT
-10
Figure 2. Base-Emitter Saturation Voltage
Collector-Emitter Saturation Voltage
40
35
30
25
20
15
10
5
0
0 25 50 75 100 125 150 175
TC[oC], CASE TEMPERATURE
Figure 4. Power Derating
©2000 Fairchild Semiconductor International
Rev. A, February 2000
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