23C32 반도체 회로 부품 판매점
STATIC READ ONLY MEMORY
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MPS
23C32
STATIC READ ONLY MEMORY
(4096x8)
23C32 STATIC READ ONLY MEMORY (4096x8)
DESCRIPTION
The 23C32 high performance read only memory is organized 4096 words by 8 bits with access
times of less than 450 ns. This ROM is designed to be compatible with all microprocessor and similar
applications where high performance, large bit storage and simple interfacing are important design
considerations.
The 23C32 operates totally asynchronously. No clock input is required. The two programmable
chip select inputs allow four 32K ROMS to be OR-tied without external decoding.
Designed to replace two 2716 16K EPROMS, the 23C32 can eliminate the need to redesign
printed circuit boards for volume mask programmed ROMS after prototyping with EPROMS.
• 400mV Noise Immunity on Inputs
• 4096 x 8 Bit Organization
• Single +5 Volt Supply
• Access Time - 450 ns
• Totally Static Operation
• TIL Compatible
• Three-State Outputs for Wire-OR Expansion
• Two Programmable Chip Selects
• Pin Compatible with 2716 & 2532 EPROM
• Replacement for 2716
• 2708/2716 EPROMS Accepted as Program
Data Inputs
ORDERING INFORMATION:
MXS 23C32
'------ PACKAGE DESIGNATOR
C=CERAMIC
P = PLASTIC
PIN CONFIGURATION
A7 VCC
A6 AS
A5 A9
A4 C52/C52
A3 C5 1 IC5 I
A2 AIO
AI All
AO 08
°1 07
02 06
03 °5
04
3-22
MPS
23C32
ABSOLUTE MAXIMUM RATINGS
Ambient Temperature under Bias
Storage Temperature
Supply Voltage to Ground Potential
Applied Output Voltage
Applied Input Voltage
'C to +70"C
-65 C to + 150' C
-O,5V to + 7.0V
-O,5V to + 7.0V
-O,5V to + 7.0V
COMMENT
Stresses above those listed under "Absolute
Maximum Ratings" may cause permanent
damage to the device. This is a stress rating
only and functional operation of the device at
these or any other conditions above those
indicated in the operational sections of this
specification is not implied.
D. C. CHARACTERISTICS (TA = 0 C to + 70 C, VCC = 5.0V ± 5%, unless otherwise specified)
t-Symbol
ICC
ICCS
10
II
VOL
VOH
VIL
VIH
Parameter
Power Supply Current
Stand-by Power Supply
Current
Output Leakage Current
Input Load Current
Output Low Voltage
Output High Voltage
input Low Voltage
:nput High Voltage
Min.
2.4
-0.5
2.0
Max.
17
10
10
10
0,4
0.8
VCC+1
Units
mA
fJA
fJA
fJA
Volts
Volts
Volts
Volts
Test Conditions
F = 1 MHz
Chip Deselected
Chip Deselected
VCC = Max. Gnd ~ VIN ~ VCC
VCC = Min. IOL = 2.1 mA
VCC = Min. IOH = -400fJA
See Note 1
A. C. CHARACTERISTICS (TA = 0 C to + 70 C. Vec = 5,OV ± 5%. unless otherwise specified)
Symbol Parameter
I
Min.
Max. Units
Test Conditions
tACC
tco
tDF
tOH
Address Access Time
Chip Select Delay
Chip Deselect Delay
Previous Data Valid
After Address Change
Delay
450
200
100
40
ns
ns
ns
ns
See Note 2
CAPACITANCE: (TA = 25"C, f = 1.0MHz, See Note 3)
Symbol
CIN
COUT
Parameter
Input Capacitance
Output Capacitance
Min.
Max.
8
10
Units
pF
pF
Test Conditions
All Pins except Pin under
Test Tied to AC Ground
Note 1: Input levels that swing more negative than -0.5V will be clamped and may cause damage to the device.
Note 2: Loadin9 1 TTL + 100 pF, input transition time: 20 ns
Timing measurement levels: input 1.5V, output 0.8V and 2.0V.
Note 3: This pal'ameter is periodically sampled and is not 100% tested.
3-23
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23C32 data
데이터시트 다운로드 :
[ 23C32.PDF ]
[ 23C32 다른 제조사 검색 ]
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