파트넘버.co.kr LH0070 데이터시트 PDF


LH0070 반도체 회로 부품 판매점

(LH0070 / LH0071) Precision BCD Buffered Reference



National Semiconductor 로고
National Semiconductor
LH0070 데이터시트, 핀배열, 회로
www.DataSheet4U.com
July 1987
LH0070 Series Precision BCD Buffered Reference
LH0071 Series Precision Binary Buffered Reference
General Description
The LH0070 and LH0071 are precision three terminal volt-
age references consisting of a temperature compensated
zener diode driven by a current regulator and a buffer ampli-
fier The devices provide an accurate reference that is virtu-
ally independent of input voltage load current temperature
and time The LH0070 has a 10 000V nominal output to
provide equal step sizes in BCD applications The LH0071
has a 10 240V nominal output to provide equal step sizes in
binary applications
The output voltage is established by trimming ultra-stable
low temperature drift thin film resistors under actual operat-
ing circuit conditions The devices are shortcircuit proof in
both the current sourcing and sinking directions
The LH0070 and LH0071 series combine excellent long
term stability ease of application and low cost making
them ideal choices as reference voltages in precision D to A
and A to D systems
Features
Y Accuracy output voltage
LH0070
10Vg0 02%
LH0071
10 24Vg0 02%
Y Single supply operation
11 4V to 40V
Y Low output impedance
0 2X
Y Excellent line regulation
0 1 mV V
Y Low zener noise
20 mVp-p
Y 3-lead TO-5 (pin compatible with the LM109)
Y Short circuit proof
Y Low standby current
3 mA
Equivalent Schematic
Connection Diagram
TO-5 Metal Can Package
Typical Applications
TL H 5550 – 1
Statistical Voltage Standard
TL H 5550 – 7
Order Number LH0070-0H LH0071-0H LH0070-1H
LH0071-1H LH0070-2H or LH0071-2H
See NS Package Number H03B
Output Voltage Fine Adjustment
TL H 5550 – 9
TL H 5550 – 8
Note The output of the LH0070 and LH0071 may be adjusted to a precise voltage by using the above circuit since the supply current of the devices is
relatively small and constant with temperature and input voltage For the circuit shown supply sensitivities are degraded slightly to 0 01% V change in VOUT
for changes in VIN and Vb
An additional temperature drift of 0 0001% C is added due to the variation of supply current with temperature of the LH0070 and LH0071 Sensitivity to the
value of R1 R2 and R3 is less than 0 001% %
C1995 National Semiconductor Corporation TL H 5550
RRD-B30M115 Printed in U S A


LH0070 데이터시트, 핀배열, 회로
www.DataSheet4U.com
Absolute Maximum Ratings
If Military Aerospace specified devices are required
please contact the National Semiconductor Sales
Office Distributors for availability and specifications
(Note 4)
Supply Voltage
40V
Power Dissipation (See Curve)
600 mW
Short Circuit Duration
Output Current
Operating Temperature Range
Storage Temperature Range
Lead Temp (Soldering 10 seconds)
Continuous
g 20 mA
b55 C to a125 C
b65 C to g150 C
300 C
Electrical Characteristics (Note 1)
Parameter
Conditions
Min Typ Max Units
Output Voltage
LH0070
LH0071
TAe25 C
10 000
10 24
V
V
Output Accuracy
b0 b1
b2
TAe25 C
g0 03
g0 02
g0 1
g0 05
%
%
Output Accuracy
b0 b1
b2
TAeb55 C 125 C
g0 3
g0 2
%
%
Output Voltage Change With
Temperature
b0
b1
b2
(Note 2)
g0 02
g0 01
g0 2
g0 1
g0 04
%
%
%
Line Regulation
b0 b1
b2
13VsVINs33V TCe25 C
0 02 0 1
0 01 0 03
%
%
Input Voltage Range
Load Regulation
Quiescent Current
Change In Quiescent Current
Output Noise Voltage
Ripple Rejection
RL e 50 kX
0 mAsIOUTs5 mA
13VsVINs33V IOUTe0 mA
DVINe20V From 23V To 33V
BWe0 1 Hz To 10 Hz TAe25 C
fe120 Hz
11 4
1
0 01
3
0 75
20
0 01
40 V
0 03 %
5 mA
1 5 mA
mVp-p
% Vp-p
Output Resistance
02 06
X
Long Term Stability
b0 b1
b2
TAe25 C (Note 3)
g0 2
g0 05
% yr
% yr
Thermal Resistance
ija (Junction to Ambient)
ijc (Junction to Case)
Tj e 150 C
200 C W
100 C W
Note 1 Unless otherwise specified these specifications apply for VINe15 0V RL e 10 kX and over the temperature range of b55 CsTAsa125 C
Note 2 This specification is the difference in output voltage measured at TAe85 C and TAe25 C or TAe25 C and TAeb25 C with readings taken after test
chamber and device-under-test stabilization at temperature using a suitable precision voltmeter
Note 3 This parameter is guaranteed by design and not tested
Note 4 Refer to the following RETS drawings for military specifications
RETS0070-0H for LH0070-0H
RETS0071-0H for LH0071-0H
RETS0070-1H for LH0070-1H
RETS0071-1H for LH0071-1H
RETS0070-2H for LH0070-2H
RETS0071-2H for LH0071-2H
2




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LH0070 buffer

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