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PDF MW4IC001NR4 Data sheet ( Hoja de datos )

Número de pieza MW4IC001NR4
Descripción RF LDMOS Wideband Integrated Power Amplifiers
Fabricantes Freescale Semiconductor 
Logotipo Freescale Semiconductor Logotipo



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Freescale Semiconductor
Technical Data
RF LDMOS Wideband Integrated
Power Amplifiers
The MW4IC001 wideband integrated circuit is designed for use as a distortion
signature device in analog predistortion systems. It uses Freescale’s newest
High Voltage (26 to 28 Volts) LDMOS IC technology. Its wideband On Chip
design makes it usable from 800 MHz to 2170 MHz. The linearity performances
cover all modulations for cellular applications: GSM EDGE, TDMA, CDMA and
W - CDMA.
Typical CW Performance at 2170 MHz,
Output Power — 900 mW PEP
28
Volts,
IDQ
=
12
mA
Power Gain — 13 dB
Efficiency — 38%
High Gain, High Efficiency and High Linearity
Designed for Maximum Gain and Insertion Phase Flatness
Excellent Thermal Stability
Characterized with Series Equivalent Large - Signal Impedance Parameters
N Suffix Indicates Lead - Free Terminations
In Tape and Reel. R4 Suffix = 100 Units per 12 mm, 7 inch Reel.
MW4IC001MR4
Rev. 3, 1/2005
MW4IC001NR4
MW4IC001MR4
800 - 2170 MHz, 900 mW, 28 V
W - CDMA
RF LDMOS WIDEBAND
INTEGRATED POWER AMPLIFIERS
CASE 466 - 03, STYLE 1
PLD - 1.5
PLASTIC
Table 1. Maximum Ratings
Rating
Drain - Source Voltage
Gate - Source Voltage
Total Device Dissipation @ TC = 25°C
Derate above 25°C
Storage Temperature Range
Operating Junction Temperature
Table 2. Thermal Characteristics
Characteristic
Thermal Resistance, Junction to Case @ 85°C
Table 3. ESD Protection Characteristics
Test Conditions
Human Body Model
Machine Model
Charge Device Model
Table 4. Moisture Sensitivity Level
Test Methodology
Per JESD 22 - A113, IPC/JEDEC J - STD - 020
Symbol
VDSS
VGS
PD
Tstg
TJ
Symbol
RθJC
Value
- 0.5, +65
- 0.5, +15
4.58
0.037
- 65 to +150
150
Value
27.3
Class
0 (Minimum)
M1 (Minimum)
C2 (Minimum)
Rating
3
Package Peak Temperature
260
Unit
Vdc
Vdc
W
W/°C
°C
°C
Unit
°C/W
Unit
°C
NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and
packaging MOS devices should be observed.
Freescale Semiconductor, Inc., 2005. All rights reserved.
RF Device Data
Freescale Semiconductor
MW4IC001NR4 MW4IC001MR4
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MW4IC001NR4 pdf
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TYPICAL CHARACTERISTICS - 900 MHz
50
IRL
46
− 15
− 17
42 ηD
− 19
38
34
30
26
22
IM3
18
14 Gps
VDS = 28 Vdc
Pout = 0.9 W (PEP)
IDQ = 14 mA
Two −Tone Measurement
100 kHz Tone Spacing
− 21
− 23
− 25
− 27
− 29
− 31
− 33
10 −35
855 860 865 870 875 880 885 890 895 900 905
f1, FREQUENCY (MHz)
Figure 3. Two-Tone Performance versus
Frequency
15
Gps
14
ηD
13
12 P1dB
11
10
9
8 VDS = 28 Vdc
7
IDQ = 14 mA
f = 880 MHz
6
0 0.2 0.4 0.6 0.8 1.0 1.2
Pout, OUTPUT POWER (WATTS)
Figure 4. CW Performance versus Output
Power
60
55
50
45
40
35
30
25
20
15
1.4
− 25
− 30
IDQ = 8 mA
− 35
10 mA
−40 18 mA
VDS = 28 Vdc
f1 = 880 MHz
f2 = 880.1 MHz
−45 16 mA
− 50
− 55
0.01
14 mA
Two −Tone Measurement
12 mA 100 kHz Tone Spacing
0.1 1 10
Pout, OUTPUT POWER (WATTS) PEP
Figure 5. Intermodulation Distortion versus
Output Power
− 25
−30 VDS = 28 Vdc
−35 IDQ = 14 mA
f1 = 880 MHz
−40 f2 = 880.1 MHz
−45 3rd Order
− 50
− 55
− 60
− 65
− 70
0.01
5th Order
7th Order
0.1
Two −Tone Measurement
100 kHz Tone Spacing
1 10
Pout, OUTPUT POWER (WATTS) PEP
Figure 6. Intermodulation Distortion Products
versus Output Power
RF Device Data
Freescale Semiconductor
− 25
− 30
− 35
− 40
−45 1 MHz
Tone
−50 Spacing = 100 kHz
0.01 0.1
10 MHz
VDS = 28 Vdc
IDQ = 14 mA
f1 = 880 MHz,
f2 = f1 + Tone Spacing
Two −Tone Measurement
1 10
Pout, OUTPUT POWER (WATTS) PEP
Figure 7. Third Order Intermodulation
Distortion versus Output Power
MW4IC001NR4 MW4IC001MR4
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MW4IC001NR4 arduino
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f = 1920 MHz
Zload
f = 2000 MHz
f = 2000 MHz
f = 1920 MHz
Zsource
Zo = 50
f = 2180 MHz
f = 2100 MHz
f = 2180 MHz
Zload
f = 2100 MHz
Zsource
Zo = 50
VDD = 28 V, IDQ = 12 mA, Pout = 0.9 W PEP
f
MHz
Zsource
Zload
1920
1930
4.238 + j15.142
4.322 + j15.362
7.764 + j28.829
8.056 + j29.352
1940
4.490 + j15.466 8.436 + j29.727
1950
1960
1970
1980
4.605 + j15.711
4.752 + j15.904
4.905 + j16.050
5.071 + j16.236
8.809 + j30.249
9.183 + j30.763
9.598 + j31.213
10.030 + j31.690
1990
5.262 + j16.446 10.546 + j32.237
2000
5.487 + j16.632 11.054 + j32.726
Zsource = Test circuit impedance as measured from
gate to ground.
Zload = Test circuit impedance as measured
from drain to ground.
Input
Matching
Network
Device
Under Test
Output
Matching
Network
VDD = 28 V, IDQ = 12 mA, Pout = 0.9 W PEP
f
MHz
Zsource
Zload
2100
2110
2.667 + j12.903
2.671 + j13.070
5.892 + j26.374
6.092 + j26.739
2120
2.664 + j13.224 6.281 + j27.094
2130
2.694 + j13.431 6.540 + j27.510
2140
2.703 + j13.511 6.748 + j27.795
2150
2160
2.702 + j13.700
2.745 + j13.952
6.996 + j28.182
7.300 + j28.678
2170
2.754 + j14.026 7.562 + j28.987
2180
2.784 + j14.206 7.862 + j29.411
Zsource = Test circuit impedance as measured from
gate to ground.
Zload = Test circuit impedance as measured
from drain to ground.
Input
Matching
Network
Device
Under Test
Output
Matching
Network
Z source
Z load
Z source
Z load
RF Device Data
Freescale Semiconductor
Figure 23. Series Equivalent Source and Load Impedance
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